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2D X-stralen verstrooiing
- nanoSTAR
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3D laser profilometer
- Rodenstock RM600 Laser Profilometer
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3D profilometer
- WYKO NT3300
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Acousto-optic scanner
- AO scanner
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AFM/STM/MFM combinatie
- q-scope
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Atomic Force Microscope (AFM)
- Topometrix Discoverer and Multimode
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Atomic Force Microscope - LFM
- Nanoscope III (contact mode)
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Atomic Force Microscope - PFM
- Topometrix Discoverer
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Auger Electron Spectroscopy
- Alpha 110 Analyzer
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BET-methode
- Micrometrics Flowsorb II 2300
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CD spectrometer
- 810
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Chemical Force Microscopy (CFM)
- Topometrix Discoverer
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Conductive Atomic Force Microscopy (CAFM)
- Multimode
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Confocal Scanning Laser Microscopy (CSLM)
- 1LM21SVF17SP
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Confocal Scanning Laser Microscopy (CSLM)
- XI 70 inverted microscope
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Differential Scanning Calorimetry (DSC)
- DSC-7 (3 toestellen), Pyris-1
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Differential Scanning Calorimetry (DSC)
- Netzsch 404
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Dynamic Mechanical Analyzer (DMA)
- Q800
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Dynamisch, mechanische, thermische Analyse (DMTA)
- DMA 2980
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Electric Force Microscopy (EFM)
- Multimode
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Electrochemical - Scanning Tunneling Microscopy (EC-STM)
- prototype
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Electron spin resonantie (ESR) spectroscopie
- EMX-10/12/ER5106QT (Q-band)
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Environmental Scanning Electron Microscopy (ESEM)
- XL30 ESEM FEG
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Fotothermische analyse
- home made
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Fourier getransformeerde infrarood spectroscopie (FTIR)
- IFS66
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Fourier getransformeerde infrarood spectroscopie (FTIR)
- System 2000 FT-IR
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FTIR
- Avatar 370
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Hardheidsmeter (Brinell)
- 1002
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Hardheidsmeter (Rockwell)
- 4-JR
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Hardheidsmeter (Shore)
- Z3.1A (Shore A) - ZW.1C (Shore C)
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Hoge resolutie röntgendiffractie (HRXRD)
- D8 discover
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Impact (kerfslag)
- Tinius Olsen 358 Joule
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Impact (kerfslag)
- Instron-Wolpert 50 Joule
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Impact (valimpact)
- prototype
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Impuls excitatie techniek (IET)
- ETMTS 1100 JWL mk V
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Impuls excitatie techniek (IET)
- HTVP 1750 IMCE
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Kratky SAXS camera
- Rigaku
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Laser ultrasone golfopstelling
- home made
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Lateral Force Microscope (LFM)
- Topometrix Discoverer and Multimode
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Low Energy Electron Diffraction (LEED)
- VG-systeem
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Magento-Optic Kerr Effect Micfoscopie (MOKE)
- Axioskop 40 POL
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massa spectroscopie (MS)
- Omnistar GSD 301 O
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Microsonde (SEM)
- JXA-733
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Modulated Differential Scanning Calorimetry (MDSC)
- model 2920
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Mössbauer Spectroscopie (MOS)
- prototype
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Nano indentatie
- NHT-S-AE-0000
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Neutronen en Synchrotron X-stralen Verstrooiing
- DUBBLE bundellijn / Grenoble
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Nucleaire resonantie verstrooiing van synchrotron stralen (NRS)
- bij ESRF
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Nuclear Reaction Analysis (NRA)
- NaI (TI) gamma detector 52B127/2M-X
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Optische microscopie (OM)
- BH-2
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Optische Microscopie (OM)
- Metalloplan
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Optische microscopie (OM)
- MeF2
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Optische microscopie (OM)
- Polyvar MET
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Optische microscopie (OM)
- M8
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Particle Induced X-ray Emission (PIXE)
- X-ray Detector GUL0035 (Window: 1 mil Be)
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Perturbed Angulare Correlation Spectroscopy (PAC)
- prototype
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Reflection High Energy Electron Diffraction (RHEED)
- MBE-systeem
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Rheometer
- ARES (Advanced Rheometric Expansion System)
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Rutherford Backscattering / Channeling Spectroscopy (RBS/C)
- Pelletron 5-SDH-2 versneller (1.7 MV)
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Scanning elektronenmicroscopie (FEGSEM)
- XL30 FEG
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Scanning elektronenmicroscopie (SEM)
- SEM 515
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Scanning elektronenmicroscopie (SEM) - OIM
- XL30
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Scanning Probe Microscope (SPM) - AFM
- Autoprobe CP
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Scanning Probe Microscope (SPM) - AFM
- Dimension 3000
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Scanning Probe Microscopy (SPM) - AFM
- Autoprobe M5
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Scanning Probe Microscopy (SPM) - STM
- Omicron
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Scanning Probe Microscopy (SPM) - STM
- prototype
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Scanning Tunneling Microscope (STM - ultra-hoogvacuüm)
- LS-STM #4
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Scanning Tunneling Microscope (STM)
- Topometrix Discoverer and Multimode Di
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Sequentiële golflengte dispersieve XRF spectrometer (WD-XRF)
- PW2400
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Surface Potential Microscopy (SFM)
- Multimode
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TGA-DSC
- Q600
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Thermal Mechanical Analyzer (TMA)
- Q400
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Transmissie Elektronenmicroscoop (TEM)
- JEM-200CX
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Transmissie Elektronenmicroscoop (TEM)
- CM 200 FEG
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Trek-drukbank (biaxiaal)
- prototype
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Trek-drukbank (dynamisch - 100kN)
- 100kN
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Trek-drukbank (dynamisch - 160kN / 200Nm / 1000bar)
- 160kN / 200Nm / 1000bar
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Trek-drukbank (dynamisch - 25kN)
- 25kN
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Trek-drukbank (dynamisch - 7kN)
- 7kN
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Trek-drukbank (minitrek)
- prototype
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Trek-drukbank (statisch - 100 kN)
- TT-DM-L
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Trek-drukbank (statisch - 100 kN)
- 4505
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Trek-drukbank (statisch - 250 kN)
- 1196
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Trek-drukbank (statisch - 30 kN)
- 5567
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Trek-drukbank (statisch - 30 kN)
- 4476
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Tribocorrosietest Pin-on-disk (POD)
- prototype
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Tribotest Fretting mode 1
- prototype
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Tribotest Fretting mode 2
- prototype
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Tribotest hoge temperatuur
- prototype
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Tribotest Pin-on-disk (POD)
- prototype
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Tribotest universeel
- prototype
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Ultrasonic Surface Analysis
- Ultrasonic C-scan
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Ultraviolet Visual Spectroscopy (UV-Vis)
- Lambda 40 spectrophotometer
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UV/Vis/NIR spectrometer
- Lambda 900
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Vibrating Sample Magnetometry (VSM)
- Maglab
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WAXD goniometer
- horizontal Geigerflex diffractometer
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Weerstandsmeting
- type 2302
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X-stralen tomografie
- HOMX + AEA Tomohawk
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X-stralen tomografie
- Skyscan 1072
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XRD hoge temperatuur
- 3003TT
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XRD inwendige spanningsmeting
- MZ IV
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XRD textuur
- D5000
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XRD textuur & spanningsmeting
- D500
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XRF laagdiktemeter
- XRF - 300 AT
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